SICD Manufacturing Scrap Yield Improvement
dc.contributor.advisor | Cruzado Vélez, Héctor J. | |
dc.contributor.author | Mulero Rivera, Jean Franco | |
dc.date.accessioned | 2024-03-11T18:54:15Z | |
dc.date.available | 2024-03-11T18:54:15Z | |
dc.date.issued | 2021 | |
dc.description | Design Project Article for the Graduate Programs at Polytechnic University of Puerto Rico | en_US |
dc.description.abstract | Defects that occur during the manufacture of a product are consider a problem that affects the yield rate of all manufacturing lines around the world. The Subcutaneous Implantable Cardioverter Defibrillator (SICD) Manufacturing Line productivity is being impacted by quality events who caused nonconformance investigation who negatively impacted the line performance. As outcome investigation, the SICD product center cable damage and fray cable defect were identified as the root cause of the performance reduction. Also, the swaging machine at SICD Manufacturing Line was identified as causal factor of both quality defects. Once identified, the defects and main causal factor, a special run was executed with the intent to test the swaging machine with the implemented adjustment. In addition, Lean Six Sigma methodology was followed to implement improvements and mitigate identified defects reoccurrence. As preventive control, new instructions, and frequencies to the preventive maintenance of the swaging machine were included. In addition, as process improvement, new inspections steps were added to the manufacturing process with the intend to capture the defect as soon as it appears in order to proceed with the mechanical failure correction. Since the implementation of all improvements, the defects reoccurrence was mitigated and the SICD Manufacturing Line productivity improved allowing to achievement a 84% of yield goal by the end of fiscal year 2021. Key Terms ⎯ Yield; Lean Six Sigma; Production Line; Swagin. | en_US |
dc.identifier.citation | Mulero Rivera, J. F. (2021). SICD Manufacturing Scrap Yield Improvement [Unpublished manuscript]. Graduate School, Polytechnic University of Puerto Rico. | en_US |
dc.identifier.uri | http://hdl.handle.net/20.500.12475/2262 | |
dc.language.iso | en | en_US |
dc.publisher | Polytechnic University of Puerto Rico | en_US |
dc.relation.haspart | San Juan | en_US |
dc.relation.ispartof | Management; | |
dc.relation.ispartofseries | Spring-2021; | |
dc.rights.holder | Polytechnic University of Puerto Rico, Graduate School | en_US |
dc.rights.license | All rights reserved | en_US |
dc.subject.lcsh | Polytechnic University of Puerto Rico--Graduate students--Research | en_US |
dc.subject.lcsh | Polytechnic University of Puerto Rico--Subject headings--Unassigned | en_US |
dc.subject.lcsh | Polytechnic University of Puerto Rico--Graduate students--Posters | en_US |
dc.subject.lcsh | Polytechnic University of Puerto Rico--Graduate School--Master in Engineering Management degree | en_US |
dc.title | SICD Manufacturing Scrap Yield Improvement | en_US |
dc.type | Article | en_US |
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