Diseño y desarrollo de un controlador de temperatura para un horno de pruebas

Abstract

Design and development of a temperature controller for a test oven As a part of quality control process, the electronics industry must make different tests to electronic components. One of these tests allows us to determine a possible fault when a component is subjected to temperature changes and when it is maintained at a high temperature for a long time interval. The heat up time and the cool down time are significant in these tests. This paper explains the design of an instrument to control the temperature in a test oven used in this kind of process in the electronics industry.